Altitude SEE Test European Platform

Coordinates: 44°38′2.2″N 5°54′26.2″E / 44.633944°N 5.907278°E / 44.633944; 5.907278

Official logo of the ASTEP platform

The Altitude SEE Test European Platform (ASTEP) is a permanent mountain laboratory and a dual academic research platform created by Aix-Marseille University, CNRS and STMicroelectronics in 2004. The current platform, operated by IM2NP Laboratory,[1] is dedicated to the problematic of Single Event Effect (SEE) induced by terrestrial radiation (atmospheric neutrons, protons and muons) in electronic components, circuits and systems. Located in the French Alps on the desert Plateau de Bure at 2552m (Dévoluy mountains), the platform is hosted by the IRAM Observatory[2] ASTEP is fully operational since March 2006.[3][4]

The platform hosts long-term experiments in the fields of real-time testing, soft error characterization and metrology. ASTEP is also permanently equipped with a neutron monitor (referenced as the Plateau de Bure Neutron Monitor, PdBNM) and a muon monitor (Plateau de Bure Muon Monitor, PdBM2). The Plateau de Bure Neutron Monitor is affiliated to the Neutron Monitor Database (NMDB) international network of instruments (code station: BURE)[5]

Timeline

Main building of the ASTEP Platform photographed in August 2012 on the Plateau de Bure.

References

  1. Institut Matériaux Microélectronique Nanosciences de Provence (IM2NP). Les plateformes techniques. Retrieved 22 May 2013 (French)
  2. Autran, J.L. et al. (2010). "Real-Time Soft-Error Rate Characterization of Advanced SRAMs", in K. Iniewski (ed.) Radiation Effects in Semiconductors, pp. 225-249. CRC Press
  3. Times Higher Education Supplement (11 July 2006). "Tests developed to examine the effect of atmospheric neutrons on microelectronic circuits in aircraft". Retrieved 22 May 2013.
  4. Yoshida, Junko (25 September 2006). "Alpine lab enters rarified air of soft-error test". EE Times. Retrieved 22 May 2013.
  5. Neutron Monitor Database. Plateau de Bure NM, France (BURE). Retrieved 22 May 2013.
  6. J.L. Autran et al., “Real-Time Soft-Error Testing of 40nm SRAMs”, IEEE International Reliability Physics Symposium, Avril 2012, 3C-5.
  7. J.L. Autran et al., “Soft-Error Rate Induced by Thermal and Low Energy Neutrons in 40 nm SRAMs", IEEE Transactions on Nuclear Science, 2012, Vol. 59, N°6, p. 2658 - 2665.
  8. G. Just et al., “Soft Errors Induced by Natural Radiation at Ground Level in Floating Gate Flash Memories”, IEEE International Reliability Physics Symposium, Avril 2013, 3D-4.

Further sources

External links

Official website

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